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The JEOL service department is dedicated to providing optimal solutions that support customer innovation. Our professionalism, knowledge, and integrity allow JEOL to achieve the highest level of quality and customer satisfaction.Expect M.O.R.E.Maintain top performance of your instrument with JEOL service. JEOL service will be your partner from the beginning and will help extend the life of your instrument through regular service and maintenance. JEOL service provides the following solutions for customers:. Room Survey. Installation. Preventive Maintenance.
Emergency Repair. Relocation. Time and Materials.
Custom Support SolutionsOrganization matters when selecting a service provider. The JEOL service organization retains a large group of highly trained and experienced professionals to provide the utmost care for your investment. With over 70 years of serving customers you can rest assured that JEOL is a partner you can rely on.Response is critical if your instrument is not operating at peak performance. JEOL has service personnel stationed throughout North America to provide the fastest industry response time to customers in need. In addition, a dedicated account manager helps to ensure that all customers speak with the appropriate knowledgeable person.Execution matters. JEOL will plan, communicate, and execute with strategic precision in all areas of instrument life. Customers can be confident that JEOL will fulfill all promises made from delivery of the instrument through installation and acceptance then continuing service life with preventive maintenance and emergency repairs.
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Realizing an unprecedented STEM-HAADF resolution of 78 pm.1 guaranteed The JEM-ARM200F ACCELARM, with a STEM Cs corrector incorporated as standard, and the mechanical and electrical stability enhanced to the utmost limit, achieves an unprecedented STEM-HAADF resolution of 78 pm.1 and 82 pm.2. And as the Cs-corrected electron probe has a dramatically increased current density, which is one order larger than conventional FE TEMs, the elemental analysis at the atomic-level becomes possible, along with an extremely enhanced throughput.1: with Cold FEG,.2: with Schottky FEG Direct observation of atomic column sites of light elements using STEM-ABF imaging The JEM-ARM200F ACCELARM provides the STEM-ABF imaging mode as standard. This technique visualizes light element column sites in crystalline samples. The STEM-HAADF image is simultaneously observable, since the distance between HAADF and BF detectors are optimized. With the two images, the sites of atomic columns can be easily estimated directly. Atomic resolution analysis with a large solid angle EDS detector Elemental analysis served with JEOL's own wide area (100 mm 2) Silicon Drift Detector (SDD).3 provides high-speed and high-sensitivity of detection.The JEM-ARM200F atomic resolution analytical microscope has achieved a scanning transmission image (STEM-HAADF) resolution of 0.08 nm, the highest in the world for any commercial TEM.
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This new generation of transmission electron microscope features an electron probe that, after aberration correction, contains a. JEOL was founded in 1949 to get the transmission electron microscope (TEM) in operation, and we can say that JEOL advanced with the development of the Japanese Society of Electron Microscopy. JEOL JEM-1400 Transmission Electron Microscope. Operating Instructions.
Login to microscope computer with your uniqname and Kerberos (level 1) password. Turn on the two camera systems. Turn on power strip and side mount camera module. Turn on second computer. Objective aperture.Comments are closed. Post navigation.